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AFM calibration methods
Scanning 19 (8): 564-581, 1997. 
AFM imaging of surfaces
Journal Link. 
AFM imaging: Interactions between the probe and sample
At very close tip-sample distances (a few angstroms), a strong repulsive force appears between the tip and the sample surface due to the overlap of atomic orbitals. The repulsive force increases as the distance between the tip and sample surface decreases. 
AFM papers
F., et al. Atomic Force Microscope. Physical Review Letters 56(9): 930-933, 1979. 
AFM probe modification
Nanotechnology 20 (47): 475701, 2009. 
AFM: Background information
The AFM probe is usually made from silicon or silicon nitride, with cantilever spring constants ranging from 0.05 to 50 N/m depending on the AFM mode of operation being employed. 
Contact mode
Force distance spectroscopy
Surface Sciences Reports 59 (1-6): 1-152, 2005
Measuring forces in the tip-sample space
It now experiences no surface forces and therefore the deflection of the cantilever is zero and the curve is flat. Figure 3. 
Review articles
Surface Science Reports 59(1-6): 1-152, 2005
Scanner artefacts
Figure 14. 
Tapping mode
Figure 5 is an example of a tapping mode image in air of carbon nanotubes on a silicon surface. 
Tip artefacts
Figure 11. 
Virtual SPM - Calibration grid
Virtual SPM - Nanotubes