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Glossary terms about Piezoelectric

Piezoelectricity is the electric charge that accumulates in certain solid materials in response to applied mechanical stress. The reverse also applies: piezoelectric materials internally generate mechanical movement in response to an applied electrical impulse.

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16 pages mention Piezoelectric

AFM calibration methods
AFM imaging of surfaces
AFM imaging: Interactions between the probe and sample
As the probe tip scans the surface at this close distance, a feedback system to the piezoelectric scanner raises and lowers the sample to keep a constant repulsive force between the tip and the sample surface. 
AFM papers
AFM probe modification
AFM: Background information
Either the probe or sample is mounted on a piezoelectric scanner which can move in the x,y, and z directions, and is used to raster scan the probe across the sample surface to acquire an image in 3 dimensions. 
Contact and tapping modes
Contact mode
Force distance spectroscopy
How is the Data Displayed?
Image artefacts
Measuring forces in the tip-sample space
The deflection of the cantilever is monitored as it is moved towards and away from the surface, and the deflection plotted as a function of piezoelectric displacement gives the force-distance curve. 
Non-contact mode
Scanner artefacts
piezoelectric elements in scanners are used to position the probe tip relative to the sample surface at the nanometer scale with great accuracy. 
Specimen choice
The AFM piezoelectric scanners are usually limited to a maximum vertical movement of approximately five microns with a maximum x-y range of 100 x 100 microns. 
Tip artefacts