training for advanced research


Glossary terms about Image

A "picture" of the surface being examined. Generally presented in false colour with bright areas representing higher areas of the quantity being measured.

▼3 more terms contain Image

22 pages mention Image

AFM calibration methods
L. Tip characterization from AFM images of nanometric spherical particles. 
AFM imaging of surfaces
AFM imaging: Interactions between the probe and sample
A plot of this upward and downward motion (z), as a function of the tip x - y position on the sample surface, provides a high-resolution image of the surface topography. 
AFM papers
L., et al. Recent Advances in Atomic-Force Microscopy of DNA. Scanning 15(5): 296-299, 1993.Journal Link... Umemura, K., Arakawa, H., et al. High-Resolution images of Cell-Surface Using a Tapping Mode Atomic-Force Microscope. 
AFM probe modification
AFM: Background information
Either the probe or sample is mounted on a piezoelectric scanner which can move in the x,y, and z directions, and is used to raster scan the probe across the sample surface to acquire an image in 3 dimensions. 
Contact and tapping modes
This means that the user gets the greatest sensitivity to measure the topography of the sample.  
Contact mode
The vertical movement is used to build an image
Force distance spectroscopy
How is the Data Displayed?
In the vast majority of cases, the data is displayed as a false colour image
Image artefacts
Tip convolution is due to the radius of curvature of the tip being similar to or larger than the width of the feature being imaged. 
Electron microscopes create magnified images of samples by focusing an electron beam using magnetic fields produced by electromagnetic lenses composed of wire coils. 
Measuring forces in the tip-sample space
It now experiences no surface forces and therefore the deflection of the cantilever is zero and the curve is flat.  
Non-contact mode
If a very thin fluid layer is covering a rigid sample, in non-contact mode the tip may be oscillating above the fluid and so the liquid layer and the underlying surface can be imaged. 
Review articles
Scanner artefacts
Nonlinearity of the x - y plane displays as surface features appearing stretched or contracted at the top of the image, and then appearing to correct nearer to the middle and bottom of the image
Specimen choice
Therefore any surface with more than five microns of roughness will be extremely difficult to image with most AFMs. 
Tailor this module
You can create you own customised menu and share it with students or colleagues by sending them a link. Drag menu items into a custom menu.  
Tapping mode
Therefore, tapping mode is preferred to image samples with structures that are weakly bound to the surface or soft samples. 
Tip artefacts
The resultant image can possess a number of tip artefacts and it is important for AFM users to recognize these artefacts. 
Virtual Scanning probe microscopy
Please select which sample you would like to view under the scanning probe microscope.  
Virtual SPM - Nanotubes